PV Electroluminescence and cell inspection

- Mono-Crystal, Poly-Crystal, and Amorphous PV-cell Inspection
- EL (Electro-luminescence) technology, combined with Near Infrared Camera and Hu-Brain’s unique mechanism distinguishes Micro-cracks from the background and enables automatic judgment
- Area image sensor (2D), or Line image sensor (1D) is used depending on application
- Custom made software by Hu-Brain (Japan)
- Glare cancel technology enables poly-crystal wafer inspection
- Visual camera inspections of printed patterns, cracks, voids
- High resolution 2D or 3D sensor is selected by application
- Custom made software by Hu-Brain

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